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晶體尺寸：8毫米電學性能：半導體晶體結構：單斜磷晶胞參數：a = 0.541nm，B = 0.375nm，C = 0.944nm，α=γ= 90#176;，γ= 97.50晶體類型：合成晶體純度：＞99.995%表征方法：XRD、拉曼、EDX
晶體尺寸：8毫米
電學性能：半導體
晶體結構：單斜磷
晶胞參數：a = 0.541nm，B = 0.375nm，C = 0.944nm，α=γ= 90°，γ= 97.50
晶體類型：合成
晶體純度：＞99.995%
表征方法：XRD、拉曼、EDX
X-ray diffraction on a ZrSe3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 3, 4, 5, 6, 7, 8
Powder X-ray diffraction (XRD) of a single crystal ZrSe3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Raman spectrum of a single crystal ZrSe3. Measurement was performed with a 785 nm Raman system at room temperature.
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